Introduction
to
 Scanning Probe Microscopy

 

Introduction
Goals and Objectives
History
Basic Theory
  - Scanning Tunneling (STM)
  - Atomic Force (AFM)

Additional SPM Methods
  - Lateral (Friction) Force
  - Magnetic Force
  - Chemical Force
  - Phase Imaging
Applications

 

 

 

Basic Theory

Atomic Force Microscopy (AFM)

Click HERE for Information on AFM Basic Theory
How does the AFM work?
  • How are forces measured?

Spring Constants
Probes
Instrumentation

  • Imaging Methods

What types of forces are measured?
Modes of Operation

-Contact
-Non-Contact
-Tapping
  • What are force curves?

What are the limitations of AFM?

 

Contact

Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099