Introduction
to
 Scanning Probe Microscopy

 

Introduction
Goals and Objectives
History
Basic Theory
  - Scanning Tunneling (STM)
  - Atomic Force (AFM)

Additional SPM Methods
  - Lateral (Friction) Force
  - Magnetic Force
  - Chemical Force
  - Phase Imaging
Applications

 

 

 

Applications

Application Notes:

At VEECO detailed information on different SPM applications can be found.

Image Galleries:

Below are links to some image galleries which demonstrate the nanoscale imaging capability and numerous applications of SPM.

Asylum Research

RHK Technology

Molecular Imaging

NT-MDT

Nanotec

NC State Analytical Instrumentation Laboratory

 

 

Contact

Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099