Introduction
to
Scanning Probe Microscopy
Introduction
Goals and Objectives
History
Basic Theory
- Scanning Tunneling (STM)
- Atomic Force (AFM)
Additional SPM Methods
- Lateral (Friction) Force
- Magnetic Force
- Chemical Force
- Phase Imaging
Applications
Goals and Objectives
Goals: The basic
theory and applications of scanning probe microscopy (SPM)
will be presented.
Emphasis will be placed on SPM characterization
methods including:
- scanning tunneling microscopy- atomic force microscopy- lateral force microscopy- chemical force microscopy- magnetic force microscopy- phase imaging
Objectives:
Upon completion of this
module you understand the basic principles, operation
and applications of SPM.
Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099