Introduction
to
 Scanning Probe Microscopy

 

Introduction
Goals and Objectives
History
Basic Theory
  - Scanning Tunneling (STM)
  - Atomic Force (AFM)

Additional SPM Methods
  - Lateral (Friction) Force
  - Magnetic Force
  - Chemical Force
  - Phase Imaging
Applications

 

 

 

Goals and Objectives

 

Goals: The basic theory and applications of scanning probe microscopy (SPM) will be presented.  Emphasis will be placed on SPM characterization methods including:
- scanning tunneling microscopy
- atomic force microscopy
- lateral force microscopy
- chemical force microscopy
- magnetic force microscopy
- phase imaging
 
Objectives:
Upon completion of this module you understand the basic principles, operation and applications of SPM.
 
 

Contact

Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099