Introduction
to
 Scanning Probe Microscopy

 

Introduction
Goals and Objectives
History
Basic Theory
  - Scanning Tunneling (STM)
  - Atomic Force (AFM)

Additional SPM Methods
  - Lateral (Friction) Force
  - Magnetic Force
  - Chemical Force
  - Phase Imaging
Applications

 

 

History
 
Click HERE for Information on the Development of SPM

Scanning Tunneling Microscope (STM)
 
Developed in 1982 by Binnig, Rohrer, Gerber, and Weibel at IBM in Zurich, Switzerland

- Binnig and Rohrer won the Nobel Prize in Physics for this invention in (1986)

Atomic Force Microscope (AFM)
 
Developed in 1986 by Binnig, Quate, and Gerber as a collaboration between IBM and Stanford University.
 

Contact

Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099