module provides an introduction to Scanning Probe
SPM is a family of microscopy techniques where a
sharp probe (2-10 nm) is scanned across a surface and
probe-sample interactions are monitored.
SPM is an extremely useful
tool that is utilized in numerous research settings ranging
from chemistry and materials to biological sciences. In
addition to imaging surfaces with nanometer resolution, SPM
can also be used to determine a variety of properties
including: surface roughness, friction, surface forces,
binding energies, and local elasticity.
This module is aimed at
presenting the basic theory and applications of SPM. It is
aimed towards undergraduates and anyone who wants an
introduction into SPM. There
are two primary forms of SPM:
Scanning Tunneling Microscopy
Atomic Force Microscopy (AFM).
The basic theory of both of these techniques is presented
here along with an introduction into some additional SPM
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