Introduction
to
Scanning Probe Microscopy
Introduction
Goals and Objectives
History
Basic Theory
- Scanning Tunneling (STM)
- Atomic Force (AFM)
Additional SPM Methods
- Lateral (Friction) Force
- Magnetic Force
- Chemical Force
- Phase Imaging
Applications
Applications
Application Notes:
At VEECO detailed information on different SPM applications can be found.
Image Galleries:
Below are links to some image galleries which demonstrate the nanoscale imaging capability and numerous applications of SPM.
Asylum Research
RHK TechnologyNC State Analytical Instrumentation Laboratory
Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099