Introduction
to
Scanning Probe Microscopy
Introduction
Goals and Objectives
History
Basic Theory
- Scanning Tunneling (STM)
- Atomic Force (AFM)
Additional SPM Methods
- Lateral (Friction) Force
- Magnetic Force
- Chemical Force
- Phase Imaging
Applications
History
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Click HERE
for Information on the Development of SPM
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Scanning Tunneling Microscope (STM)Developed in 1982 by Binnig, Rohrer, Gerber, and Weibel at IBM in Zurich, Switzerland- Binnig and Rohrer won the Nobel Prize in Physics for this invention in (1986)
Atomic Force Microscope (AFM)Developed in 1986 by Binnig, Quate, and Gerber as a collaboration between IBM and Stanford University.
Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099