Introduction
to
Scanning Probe Microscopy
Introduction
Goals and Objectives
History
Basic Theory
- Scanning Tunneling (STM)
- Atomic Force (AFM)
Additional SPM Methods
- Lateral (Friction) Force
- Magnetic Force
- Chemical Force
- Phase Imaging
Applications
Additional SPM Methods
Click Below for an Introduction into some other Common SPM Methods
Robert Wilson and Heather Bullen, Department of Chemistry, Northern Kentucky University